000			01537pam a2200301 i 4500
001			77004773
003			DLC
005			20240419154421.0
008			770321s1977 dcua 10000 eng
010			_a 77004773
040			_aDLC _cDLC _dDLC
043			_an-us---
050	0	0	_aQC100 _b.U57 no. 500-8 _aTA1650
082	0	0	_a602/.1 s _a621.381.9/598
086			_aC13.10:500-8.
111	2	0	_aWorkshop on Standards for Image Pattern Recognition, _cNational Bureau of Standards, _d1976.
245	1	0	_aComputer science & technology : _bproceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976 / _cWorkshop on Standards for Image Pattern Recognition ; John M. Evans, Jr., Russell Kirsch, and Roger N. Nagel, editor[s] ; sponsored by National Bureau of Standards, Electronic Industries Association, Institute of Electrical and Electronic Engineers, in cooperation with Association for Computing Machinery.
260	0		_a[Washington] : _bU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., _c1977.
300			_avii, 112 p. : _bill. ; _c26 cm.
490	1		_aNBS special publication ; 500-8
650		0	_aOptical pattern recognition _xStandards _zUnited States.
700	1	0	_aEvans, John Martin, _d1942-
700	1	0	_aKirsch, Russell.
700	1	0	_aNagel, Roger N.
710	1	0	_aUnited States. _bNational Bureau of Standards.
810	1		_aUnited States. _bNational Bureau of Standards. _tSpecial publication ; _v500-8.
999			_c864 _d864
942			_cMX